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| TC74HC279AP/AF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC279AP,TC74HC279AF Quad S -R Latch The TC74HC279A is a high speed CMOS QUAD S-R LATCH fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. Each latch has an independent Q output and Set and Reset inputs. S and R are active low. When S input is low, the Q output goes high and when R input is low, the Q output goes low. When both S and R are low, S takes precedence resulting Q = low. When both of S and R are held high, Q output doesn't change. All inputs are equipped with protection circuits against static discharge or transient excess voltage. TC74HC279AP TC74HC279AF Features * * * * * * * High speed: tpd = 12 ns (typ.) at VCC = 5 V Low power dissipation: ICC = 2 A (max) at Ta = 25C High noise immunity: VNIH = VNIL = 28% VCC (min) Symmetrical output impedance: |IOH| = IOL = 4 mA (min) Balanced propagation delays: tpLH tpHL - Wide operating voltage range: VCC (opr) = 2 to 6 V Pin and function compatible with 74LS279 Weight DIP16-P-300-2.54A SOP16-P-300-1.27A : 1.00 g (typ.) : 0.18 g (typ.) Pin Assignment 1 2007-10-01 TC74HC279AP/AF IEC Logic Symbol 1S1 1S2 1R 2S 2R 3S1 3S2 3R 4S 4R (2) (3) (1) (6) (5) (11) (12) (10) (15) (14) & R S2 R & R S4 R S3 S1 1 2 3 4 (4) (7) (9) (13) 1Q 2Q 3Q 4Q Truth Table Inputs S# Output R H H L L Q Qn H L H H L H L Qn: The level of Q before the indicated input condition were established. #: For latches with doubles S input. H = Both S input high L = One of both inputs low System Diagram 2 2007-10-01 TC74HC279AP/AF Absolute Maximum Ratings (Note 1) Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5 to 7 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 20 20 25 50 Unit V V V mA mA mA mA mW C 500 (DIP) (Note 2)/180 (SOP) -65 to 150 Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = -40 to 65C. From Ta = 65 to 85C a derating factor of -10 mW/C shall be applied until 300 mW. Operating Ranges (Note) Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2 to 6 0 to VCC 0 to VCC -40 to 85 Unit V V V C 0 to 1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0 to 500 (VCC = 4.5 V) 0 to 400 (VCC = 6.0 V) ns Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 3 2007-10-01 TC74HC279AP/AF Electrical Characteristics DC Characteristics Characteristics Symbol Test Condition VCC (V) 2.0 High-level input voltage VIH Ta = 25C Min 1.50 3.15 4.20 Ta = -40 to 85C Max Unit Typ. Min 1.50 3.15 4.20 Max 4.5 6.0 2.0 V 0.50 1.35 1.80 0.50 1.35 1.80 Low-level input voltage VIL 4.5 6.0 2.0 V 1.9 4.4 5.9 4.18 5.68 2.0 4.5 6.0 4.31 5.80 0.0 0.0 0.0 0.17 0.18 1.9 4.4 5.9 4.13 5.63 IOH = -20 A High-level output voltage VOH VIN = VIH or VIL IOH = -4 mA IOH = -5.2 mA IOL = 20 A Low-level output voltage VOL VIN = VIH or VIL IOL = 4 mA IOL = 5.2 mA Input leakage current Quiescent supply current IIN ICC VIN = VCC or GND VIN = VCC or GND 4.5 6.0 4.5 6.0 2.0 4.5 6.0 4.5 6.0 6.0 6.0 V 0.1 0.1 0.1 0.26 0.26 0.1 0.1 0.1 0.1 0.33 0.33 1.0 A A V 2.0 20.0 AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25C, input: tr = tf = 6 ns) Characteristics Output transition time Propagation delay time ( S1 , S2 -Q) Symbol tTLH tTHL Test Condition Min Typ. 4 Max 8 Unit ns tpLH tpHL tpLH tpHL tpLH tpHL 12 22 ns Propagation delay time ( S -Q) Propagation delay time ( R -Q) 9 17 ns 11 20 ns 4 2007-10-01 TC74HC279AP/AF AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns) Characteristics Symbol Test Condition VCC (V) tTLH tTHL 2.0 Ta = 25C Min Ta = -40 to 85C Max 75 15 13 130 26 22 100 20 17 120 24 20 10 Unit Typ. 30 8 7 45 15 13 38 12 10 42 14 12 5 18 Min Max 95 19 16 165 33 28 125 25 21 150 30 26 10 Output transition time 4.5 6.0 2.0 ns Propagation delay time ( S1 , S2 -Q) Propagation delay time ( S -Q) Propagation delay time ( R -Q) Input capacitance Power dissipation capacitance tpLH tpHL tpLH tpHL 4.5 6.0 2.0 ns 4.5 6.0 2.0 ns tpLH tpHL CIN CPD (Note) 4.5 6.0 ns pF pF Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC/4 (per circuit) 5 2007-10-01 TC74HC279AP/AF Package Dimensions Weight: 1.00 g (typ.) 6 2007-10-01 TC74HC279AP/AF Package Dimensions Weight: 0.18 g (typ.) 7 2007-10-01 TC74HC279AP/AF RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 20070701-EN GENERAL * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01 |
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